Year	2011
Authors	David Shan-Hill Wong
Paper Title	A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering. Author(s) : Pan TH, Sheng BQ, Wong DSH, Jang SS Source: IEEE Transactions on Industrial Informatics Volume: 7 Issue: 2 Page: 187-195 Published: 2011
Language	Chinese
Reference URL	https://ieeexplore.ieee.org/document/5692873