年度	2011
全部作者	汪上曉 David Shan-Hill Wong
論文名稱	A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering. Author(s) : Pan TH, Sheng BQ, Wong DSH, Jang SS Source: IEEE Transactions on Industrial Informatics Volume: 7 Issue: 2 Page: 187-195 Published: 2011
語言	中文
參考連結	https://ieeexplore.ieee.org/document/5692873